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Reliability Improvement Training

Have you ever wondered why it is difficult to find defects during Reliability Testing, yet the customers find issues you have not encountered?

If so, the 'Electronic Product Reliability Improvement Seminar' provided by Martin Shaw of Reliability Solutions will help you understand the most effective and most efficient methods of Reliability Stress Testing to provide a focused approach to ongoing Reliability Improvement and Control.

Too many Electronic Product Manufacturing companies spend too much money on old style Reliability Testing which brings limited benefit. Many companies are changing their approach to gain better return from their investment and minimise cost of field failures.

Using the Reliability Solutions approach allows many manufacturers to improve early life fail rates using a totally new approach to testing. This is also used to deal with 'Maverick Lots', enabling manufacturers to deal confidently with disposition, based on short, high stress acceptance testing.

The popular Reliability Solutions ' Improving Reliability In Record Time' seminar focuses on the critical areas of improvement to manage Reliability Improvement.

Often in standard training seminars, students only manage to apply 20% of what they are taught, but the Reliability Solutions content ensures a minimal of 80% can be applied in a very short time period to maximise opportunity for improvement and cost savings. A quite unique training agenda is made available for any electronic design or manufacturing company, this can also be tailored to meet the more exact needs of any specific company.

The training agenda includes the following subjects which are critical for electronic reliability and improvement.

Day 1

  • Basic Introduction to Reliability Improvement and the ‘Unique’ Reliability Solutions approach to reach World Class levels in ‘Record Time’
  • Application of Bathtub Curve theory and its application at product and component level with Description of different failure modes to predict Failure Patterns and the Importance of EARLY LIFE Reliability
  • Importance of Exponential and Normal Distributions in Reliability Prediction and Definition of Hazard Rate and its importance in Reliability estimation
  • Understanding Accelerated Testing to set up Predictive Testing Models and Reduce Design Cycle Test costs
    • Application of Voltage, Humidity, Temp Acceleration modelling
    • Minimising Sample Sizes and Maximising Test Efficiency
  • Use of Arrhenius Equation to define Acceleration levels under Temperature
    • Modelling the ‘Activation’ Energy at Component and Product levels using Real Life Case Studies
    • Selecting the Appropriate Activation Energy and understanding why it is so important to Reliability demonstration
  • Calculating Acceleration Factor of Thermal Cycling on SMT components and Solder Joints using the Coiffon-Manson Model
    • Modelling the benefits of low level Thermal Cycling
    • Using the Engelmaier Model to predict SMT Solder Joint Fatigue Life
  • Applying the Reliability Solutions Early Life Test model to Reduce Test Cycle Time and Reduce Sample needs
  • Breaking down a Product into Sub-Assemblies and performing Highly accelerated Early Life and Long Life Reliability Testing for maximum Defect detection
    • Using the Reliability Solutions Statistical model to predict Sub-assy Field Fail Rates and converting into overall combined product failure prediction

Day 2

  • Understanding the direct relationship between Process Failure / Yield levels and Field Failure rates
    • Using the Reliability Solutions model to predict Field Failure Rates from Process Yield data
    • Real Life LCD TV case Study showing methods used and correlation with Actual Field data
  • Weibull Distribution Statistical Properties and Real-Life Application of theory
    • Weibull Plotting and use in Reliability prediction
    • Focusing on Characteristic Lifetime, using burn-in data to predict Early Life Fail rates
  • Weibull Distribution Statistical Properties and Real-Life Application of theory
    • Planning Life Testing using optimum Acceleration Models and applied statistics to minimise sample needs and test time
  • Understanding best methods of statistical Reliability Prediction and the pitfalls of making wrong assumptions
  • How to evaluate effectiveness of different stress test types with the Hughes Test Strength Equation
    • Selecting the correct stress tests to maximise the opportunity of detecting Reliability defects during the Design Stage, Focusing on Early Life Defects with Electronic Products
  • Developing an Effective Reliability test Strategy , using Modern stress techniques, including Random Vibration and Thermal Cycling
  • Designing the most effective Low Volume Reliability Stress Tests by combining different forms of stress in most effective manner / sequence
  • Assessing the optimum stress test sequence and a Case Study based on Power Supply Q&R Improvement
  • Dealing with No Fault Found Conditions
    • Effect of Repetitive Stress to Induce Failure